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Note: No formal accuracy tests were conducted and these data are disseminated to allow discussion related to methods. Sample Analyses: Samples were processed at both the USGS in Menlo Park, CA, and at UC Berkeley following established methodology for separating organic material from sinter (Howald et al., 2014; Lowenstern et al., 2016; Slagter et al., 2019). First, the exterior surface of each sample was removed using a rock saw, and then any further material was removed if there was any visible algal material in the interior of the sample. Second, samples underwent a series of chemical baths. Samples were crushed and soaked in 30% hydrogen peroxide for 48 hours to remove any remaining modern algae. Once cleaned,...
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Sample Analyses: Thin sections made at UC Berkeley were brought to the USGS, Menlo Park, CA and were coated with 25 nm carbon. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 50 mm2 X-MaxN energy dispersive spectrometer. Thin sections were imaged with backscatter electrons. Energy dispersive X-ray spectroscopy (EDS) analyses and images were collected with an accelerating voltage of 15 kV and a working distance of 15 mm. Database Contents: The data files for “Energy Dispersive X-ray Spectroscopy (EDS) Data” contain representative element spectra analyses of samples UGB-TD-28, -30, -31, -32, -33, -36.
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Sample Analyses: Thin sections made at UC Berkeley were brought to the USGS, Menlo Park, CA and were coated with 25 nm carbon. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM) equipped with an Oxford 50 mm2 X-MaxN energy dispersive spectrometer. Thin sections were imaged with backscatter electrons. Database Contents: The data files for “SEM Images of Sinter Thin Sections” contain representative SEM images of thin sections of samples UGB-TD-24, -27, -28, -29, -31, -32.
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Sample Analyses: Unpolished bulk centimeter-scale sinter sub-samples were affixed to aluminum stubs using amorphous carbon paste and coated with 10 nm Au-Pd. Samples were analyzed at the USGS in Menlo Park, CA in a Tescan VEGA3 Scanning Electron Microscope (SEM). Stub-mount samples were imaged with secondary electrons. Database Contents: The data files for “SEM Images of Bulk Sinter Samples” contain representative SEM images of cm-size pieces of sub-samples UGB-TD-25, -26, -28, -30, -31, -33, -35.


    map background search result map search result map Energy Dispersive X-ray Spectroscopy (EDS) Data SEM Images of Sinter Thin Sections SEM Images of Bulk Sinter Samples a. Carbon Isotope Data Energy Dispersive X-ray Spectroscopy (EDS) Data SEM Images of Sinter Thin Sections SEM Images of Bulk Sinter Samples a. Carbon Isotope Data