Skip to main content
Advanced Search

Filters: Tags: hyperspectral imaging (X) > Extensions: Raster (X)

2 results (115ms)   

View Results as: JSON ATOM CSV
thumbnail
Reflectance data from HyMap™ were processed using the Material Identification and Characterization Algorithm (MICA), a module of the USGS PRISM (Processing Routines in IDL for Spectroscopic Measurements) software (Kokaly, 2011), programmed in Interactive Data Language (IDL; Harris Geospatial Solutions, Broomfield, Colorado). The HyMap reflectance data are provided and described in this data release. MICA identifies the spectrally predominant mineral(s) in each pixel of imaging spectrometer data by comparing continuum-removed spectral features in the pixel’s reflectance spectrum to continuum-removed absorption features in reference spectra of minerals, vegetation, water, and other materials. Linear continuum removal...
thumbnail
A map of the wavelength position of the white mica 2,200 nanometer (nm) Al-OH absorption feature was compiled for a region of Nabesna, Alaska, using HyMap™ reflectance data provided and described in this data release. White mica wavelength position was computed for each pixel with spectrally predominant muscovite or illite. The computation was made using a function of the USGS PRISM (Processing Routines in IDL for Spectroscopic Measurements) software (Kokaly, 2011), programmed in Interactive Data Language (IDL; Harris Geospatial Solutions, Broomfield, Colorado). The PRISM function applies linear continuum-removal (Clark and Roush, 1984) to the 2,200 nm feature and fits a parabola to three channels: the channel...


    map background search result map search result map Mineral predominance map for Nabesna, Alaska, derived from imaging spectrometer reflectance data White mica wavelength position map for Nabesna, Alaska, derived from imaging spectrometer reflectance data Mineral predominance map for Nabesna, Alaska, derived from imaging spectrometer reflectance data White mica wavelength position map for Nabesna, Alaska, derived from imaging spectrometer reflectance data